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MNT108 (1 Credit)
Overview of fundamental statistical process control concepts and methods with emphasis on practical application in semiconductor manufacturing. Focus on reading, interpreting, and monitoring control charts rather than complex statistical calculations. Introduction to Six Sigma methodologies, waste identification, and quality system implementation for manufacturing technicians. Prerequisites: None.
- Term
- Fall 2026
- Weeks
- 4
- Delivery
- Online
- Designations
- None
- Next Start
- 9/21